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Semiconductor Material and Device Characterization IEEE Press 3rd Edition
Item #: 21176075

Semiconductor Material and Device Characterization IEEE Press 3rd Edition

Item #: 21176075

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What Stands Out

Comprehensive Coverage
This edition offers extensive insights into semiconductor materials and device fabrication, providing a holistic understanding crucial for students and professionals in electronics and materials science.
Updated Techniques
Incorporating the latest characterization methods, this book equips readers with contemporary tools to effectively analyze semiconductor properties and performance, ensuring relevance in today's fast-paced technological landscape.
Practical Applications
Featuring real-world examples and case studies, it bridges theory and practice, making complex concepts accessible and applicable for engineers and researchers in the semiconductor industry.

Product Details

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Publisher Wiley-IEEE Press
Publication date June 29, 2015
Edition 3rd
Language English
Print length 800 pages
ISBN-10 0471739065
ISBN-13 978-0471739067
Item Weight 2.11 pounds (960 grams)
Dimensions 6.4 x 2 x 9.4 inches (16.3 x 5.1 x 23.9 cm)

Who Should Buy?

Suitable For
  • Engineering Students

    Ideal for engineering students specializing in semiconductor technology and device fabrication for their coursework.

  • Industry Professionals

    Beneficial for professionals working in semiconductor manufacturing and research focusing on material properties and device performance.

  • Research Scientists

    Useful for researchers investigating the physical properties of semiconductor materials and their applications in device technology.

Not Suitable For
  • General Readers

    Not suitable for laypersons seeking basic information on electronics without technical background in semiconductors.

Product Description

Semiconductor Material and Device Characterization IEEE Press 3rd Edition

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Semiconductors Editorial Review

"Semiconductor Material and Device Characterization" is a highly recommended reference book for professionals working in the field of semiconductor material and device. It is an incredible resource for engineers and materials scientists in need of a comprehensive guide. The book assumes a working knowledge of semiconductor physics, which is essential for getting the most out of the text. It is well-referenced and provides a thorough explanation of the principles behind various characterization techniques. Additionally, the book includes original references for those seeking more detailed information. Although primarily targeted at lab use, many readers have found this book valuable enough to include it in their personal libraries. Overall, "Semiconductor Material and Device Characterization" is Considered a must-have resource for anyone working in the semiconductor field.

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Pros

  • Comprehensive and detailed guide for semiconductor material and device characterization
  • Well-referenced with explanations of underlying principles
  • Valuable resource for professionals in the field

Cons

  • Assumes a working knowledge of semiconductor physics, which may be challenging for beginners

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